Test Software
programs, procedures or rules and associated documentation pertaining to the operation of a computerized test set.
See Also: Test Software Development, Software Testing
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I-Pi SMARC Development Kit Based On NXP® I.MX 95 Six-Core Arm® Cortex-A55, M7 & M33
I-Pi SMARC IMX95
The ADLINK LEC-IMX95 is a powerful and versatile SMARC module that delivers high-performance computing, graphics, machine learning, and vision capabilities for IoT and industrial applications. It is based on the NXP i.MX95 processor, which integrates six Arm Cortex-A55 cores, one Arm Cortex-M7 core, one Arm Cortex-M33 core, an Arm Mali GPU, an ISP, and an eIQ Neutron NPU that can run at up to 2 TOPS.
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6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Rotary And Turbine Gas Meter Test Bench DN25-DN300mm
Bofa Instrument & Equipment Co., Ltd
This test bench adopts sonic nozzle as standard reference and minus pressure principle, following International standards ISO9300, it consists of calculating unit, testing table, dynamical system, sampling and controlling system and administrative software, etc. The testing result can be saved and printed out.
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EVSE Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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6TL22 Off-Line Testing Platform
H71002200
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Software Application Testing
Software application testing can cover many parameters depending on the application. The testing can be done to verify the basic functionality of the software and to see how it performs under different network conditions. This type of testing can be performed during development as each iteration of the software is released, and once the application has been rolled out.
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Fixture Self-Test Controller and Calibration Check
AQ818
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Computer Monitor & LCD Analyzer
MonitorTest 2.2
PassMark MonitorTest is a tool that allows users to investigate the quality and performance of their computer monitor or LCD flat panel screens. With more people spending more time in front of computer monitors it is important to purchase a quality monitor that will provide crisp, bright images, while reducing the strain on your eyes. The MonitorTest software generates test patterns on the screen at a variety of different resolutions and color depths to test for optimum visual performance.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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PXIe-6345, 80 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module
783631-01
PXIe, 80 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6345 offers analog I/O, digital I/O, and four 32‑bit counter/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital tim...show more -
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Test Automation Framework
RedwoodHQ
RedwoodHQ is a single web based User Interface that allows companies to develop scripts and create keyword driven test cases based for their software applications. RedwoodHQ will then allow for execution and results analysis in an easy to use and easy to manage environment. RedwoodHQ works well with others. Not only does RedwoodHQ offer built-in support for Selenium, it also includes Webservices, databases, CLI, and SSH out of the box. As users delve into RedwoodHQ, they will find that they are able to easily expand to any Java based opensource and licensed tool.
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Java Apps Test Software
JRebel
Supports Wildfly and TomEE 1.6.0 Supports EJBs on WebSphere 8.5.5 and JBoss 6EAP, 7.1, 7.2 Supports Spring 4 and PrettyFaces Adds remoting for standalone applications And many more improvements
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Automated Distortion Characterization and Information System
ADCS
Matrix Test Equipment Incorporated
The Automated Distortion Characterization and Information System (ADCS) is an extension of the Matrix equipment control software that automatically makes RF measurements selected from the following: Cross Modulation (XMOD), Composite Triple Beat (CTB), Composite Second Order (CSO), Carrier to Noise (C/N), Discrete Second Order, Discrete Third Order Distortion. Measurements are made, and the test results and a profile describing the test conditions are saved in a database for later retrieval or reporting.
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Test Bench for AC Compressors
MS111
The test bench is intended to test AC compressors of wide range of vehicles on R134a refrigerant. The equipment detects failures of a vehicle unit before its mounting in a car, whether it is a remanufactured, repaired unit or a used one. In the process of testing, data is shown on LCD display. It gives an opportunity to follow testing results realtime, save and/or print them due to software special features. Unit fixation mechanism is very flexible: a compressor can be easily fixed, no matter wh...show more -
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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PXI-2568, 31-Channel, 2 A, SPST PXI Relay Module
778572-68
31-Channel, 2 A, SPST PXI Relay Module—The PXI‑2568 is a general-purpose switch module that features independent single‑pole single‑throw (SPST) Form A armature relays. Each relay is nonlatching with very low on-resistance and low thermal offsets. The PXI‑2568 is fully software programmable. With an efficient coupling of voltage/current capability and relay density, this switch module is ideal for automated test equipment (ATE) loads or for controlling heaters, lights, and fans.
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RF Testing Platform for ATx05
AT118
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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PXIe-5646, 6 GHz, 200 MHz Bandwidth, RF PXI Vector Signal Transceiver
782952-01
6 GHz, 200 MHz Bandwidth, RF PXI Vector Signal Transceiver—The PXIe‑5646 combines a vector signal generator and vector signal analyzer with FPGA-based real-time signal processing and control into a single device, also known as a VST. Because of this software-designed approach, the PXIe‑5646 features the flexibility of a software defined radio architecture with RF instrument class performance. The additional bandwidth of the PXIe‑5646 enables you to test wireless and cellular standards such as 802.11ac 160 MHz and LTE‑A carrier aggregation while leveraging the latest performance-enhancing processing techniques such as digital predistortion.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
